Ultra-Low Noise JFETs

Ultra-Low Noise JFETs are ideal for a variety of high performance applications including microanalysis, Energy Dispersive X-ray Fluorescence (EDXRF), and X-ray Diffraction (EDXRD). Moxtek® manufactures both 3 pin and 4 pin N-channel JFETs. Moxtek ultra-low noise JFETs have a low leakage current, high transconductance (gm) and low input capacitance (Cgs). JFETs are available as a bare die or packaged in Teflon, TO-72, or nailhead packages (see images below). Each JFET is guaranteed to meet data sheet specifications.

JFET BVgss(V) Vgs(off) (V) Idss (mA) gm (mS) Cgs (pF)
Test Conditions

Vds=0v,

Ig= 1µA, Vsub- 0v

 

Vsub=0V,

Id= 1nA

 

Vgs= 0v,

Vsub= 0V

Vds= 4V,

Id= 5mA, 20°C

Vds= 4V,

Id= 5mA, Vgs= 0V

MX-11rc* 25 2.5 20 5 0.7
MX-16 26 10 300 28 4
MX-120 27 9 64 16 1.7
MX-16rc 30 5.5 52 8 2.7
MX-20 26 10 29 8 0.9
MX-30 31 10 20 6 0.6
MX-40 27 9 12 4.5

0.4

Features:

  • 3 and 4 terminal configuration
  • Multiple/ Customizable packages
  • 100% device testing
  • High input impedance
  • Low input capacitance
  • Low leakage current

Benefits:

  • Excellent signal amplification
  • Multiple applications
  • Match JFET capacitance to sensor
  • Dependable quality
  • Low signal distortion

Bare Die                           TO-72                  Nailhead

Teflon Package

 

 

 
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