Ultra-Low Noise JFETs

Ultra-Low Noise JFETs

Ultra-Low Noise JFETs are ideal for a variety of high performance applications including microanalysis, Energy Dispersive X-ray Fluorescence (EDXRF), and X-ray Diffraction (EDXRD). Moxtek^® manufactures both 3 pin and 4 pin N-channel JFETs. Moxtek ultra-low noise JFETs have a low leakage current, high transconductance (g_m) and low input capacitance (C_gs). JFETs are available as a bare die or packaged in Teflon, TO-72, or nailhead packages (see images below). Each JFET is guaranteed to meet data sheet specifications.

JFET	BV_gss(V)	V_gs(off) (V)	I_dss(mA)	g_{m (mS)}	C_gs (pF)
Test Conditions	V_ds=0v, I_g= 1µA, V_sub- 0v	V_sub=0V, I_d= 1nA	V_gs= 0v, V_sub= 0V	V_ds= 4V, I_d= 5mA, 20°C	V_ds= 4V, I_d= 5mA, V_gs= 0V
MX-11rc*	25	2.5	20	5	0.7
MX-16	26	10	300	28	4
MX-120	27	9	64	16	1.7
MX-16rc	30	5.5	52	8	2.7
MX-20	26	10	29	8	0.9
MX-30	31	10	20	6	0.6
MX-40	27	9	12	4.5	0.4

Features:

3 and 4 terminal configuration
Multiple/ Customizable packages
100% device testing
High input impedance
Low input capacitance
Low leakage current

Benefits:

Excellent signal amplification
Multiple applications
Match JFET capacitance to sensor
Dependable quality
Low signal distortion

Bare Die TO-72 Nailhead

Teflon Package