Elemental Analysis

X-ray emission spectroscopy, and X-ray fluorescence (XRF) are well established techniques used for identifying elements in unknown materials.

The precision of analysis and the detection limits are dictated by the brilliance and resolution of the x-ray source and detector. Moxtek® x-ray sources, based on the MAGNUM® technology, provide an excellent spectrum purity and high brilliance necessary for high resolution quantitative XRF analysis. Table 1 shows the characteristics of typical Moxtek x-ray sources and Figure 1 shows examples of the spectra optimized for a specific application. Another characteristic of the x-ray source critical for the elemental analysis is the stability of the output. Figure 2 shows the long term stability of x-ray sources.

Tube type
(@40kV)
Photons/s
/sr/0.1mA

Max photons/s
/sr

Solid angle (sr)
& full cone angle

Est. total flux
photons/s/0.1mA

% Of counts in
main excitation peaks

Au (type A) 6.1 x1011 3.0 x1011 (@50 μA) ˜2π(0.9 ), 170° ˜34 x1011 26% (Lα & Lβ)
Au (type B) 3.0 x1011 6.0 x1011 (@200 μA) ˜2π(0.06), 40° ˜1.1 x1011 28% (Lα & Lβ)
Au (@50 kV) 4.6 x1011 9.2 x1011 (@200 μA) ˜2π(0.06), 40° ˜1.7 x1011 22% (Lα & Lβ)
W 2.7 x1011 2.7 x1011 (@100 μA) ˜2π(0.06), 40° ˜1.0 x1011 25% (Lα & Lβ)
W side window 3.0x1011 3.0 x1011 (@100 μA) ˜2π(0.09), 50° ˜1.7 x1011 25% (Lα & Lβ)
Cr side window 1.9 x1011 1.9 x1011 (@100 μA) ˜2π(0.09), 50° ˜0.7 x1011 64% (88% Kα & 12% Kβ)
Mo 1.3 x1011 1.3 x1011 (@100 μA) ˜2π(0.06), 40° ˜0.5 x1011 13% (Kα)
Ag 1.4 x1011 1.4 x1011 (@100 μA) ˜2π(0.06), 40° ˜0.5 x1011 5% (Kα)
Ag (@30kV) 0.8 x1011 0.8 x1011 (@100 μA) ˜2π(0.06), 40° ˜0.3 x1011 2.3% (Kα)
Ag Microfocus (@30kV) 0.9 x1011 0.9 x1011 (@100 μA) ˜2π(0.02), 25° ˜0.1 x1011 2.7% (Kα)

 

x-ray stability chart

 
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